CHE661A - Analytical & Material Characterization Techniques Of Engineers
Prerequisites:
3-0-0-9
Course Contents
- Introduction: Various terms in measurement. Accuracy, precision, selectivity, limit of detection, sensitivity, response time, reliability, signal/noise and sources of noise/errors.
- Chemical analysis of materials: Techniques for the analysis of structure, chemical composition and trace impurities in materials. X-ray photoelectron spectroscopy (XPS), mass spectrometry (MS) and other spectroscopy techniques at atomic and molecular levels.
- Microscopy and diffraction: Optical microscopy, Scanning probe microscopy, Electron microscopy (both SEM and TEM), X-ray Diffraction. Theoretical and practical aspects of the microscopy and diffraction techniques will be introduced. Imaging using scanning tunneling microscope (STM) will also be considered.
- Thermal analysis: Applications of thermal analysis. Various techniques such as TGA, DSC, DTA, and TMA will be covered.
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